DESIGN OF STANDARD CELL ASIC’S USING SELF GATED RESONANT CLOCKED FLIP FLOP

Abstract

Efforts to reduce power consumption of digital CMOS circuits have been in progress for nearly three decades. As a result, a number of well understood and proven techniques for reducing dynamic and leakage power have been developed. These methods are implemented thoroughly in the circuit level. So we have to shift our concentration towards high level circuits. One of the example for high level circuit is a standard cell Application Specific Integrated Circuit (ASIC). Reducing the power and delay of standard cell ASIC can improve the performance of the system designed using these. A major contributor to the total power in modern microprocessors is the clock distribution network, which can dissipate as much as 70% of the total power for high performance applications. Self-gated resonant-clocked flip-flop optimized for power efficiency and signal integrity achieves reduced dynamic power dissipation, in addition to the negative setup time, which makes the design more tolerant to the clock skew. This feature also reduces the D-Q delay, thus improving the timing performance of the flip-flop. The advantages of the Self gated resonant clocked flip-flop are implemented on standard cell ASICs. Cadence EDA tools and the 180nm process technology files have been used to substantiate the merits of the proposed design.