Abstract
An apodized thickness design method for discrete layer notch filters is presented. The method produces error tolerant designs with low ripple in the passband regions without any additional numerical optimization. Several apodization functions including Gaussian, cosine squared, as well as quintic are considered. Theoretical and experimental results from ion beam deposited sample designs for single-notch as well as multinotch filters are presented. Good agreement is observed between the theoretical design and the experimental measurement even when the deposition process is only controlled on time. This demonstrates the low layer error sensitivity of the apodized designs.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
