Design of Mixed-Voltage I/O Buffer by Using NMOS-Blocking Technique

Abstract

An nMOS-blocking technique for mixed-voltage I/O buffer realized with only 1timesVDD devices can receive 2timesVDD , 3timesVDD, and even 4timesVDD input signal without the gate-oxide reliability issue is proposed. In this paper, the 2timesVDD input tolerant mixed- voltage I/O buffer by using the nMOS-blocking technique has been verified in a 0.25-mum 2.5-V CMOS process to serve 2.5/5-V mixed-voltage interface. The 3timesVDD input tolerant mixed-voltage I/O buffer by using the nMOS-blocking technique has been verified in a 0.13-mum 1-V CMOS process to serve 1/3-V mixed-voltage interface. The proposed nMOS-blocking technique can be extended to design the 4timesVDD , 5timesVDD, and even 6timesVDD input tolerant mixed-voltage I/O buffers. The limitation of the nMOS-blocking technique is the breakdown voltage of the pn-junction in the given CMOS process