Abstract

The calibration of Automated Test Equipment(ATE) is an important part of microelectronics measurement. To achieve full calibration of high-speed ATE, each high-speed digital channel should be traced to the calibration equipment. This paper provides a design of high-speed signal switching system, which can effectively reduce or even eliminate the impact of path impedance discontinuity caused by the change of switching impedance, protect the safety of equipment and the stability of the signal to be measured, and effectively reduce the wave reflection effect caused by the change of impedance at the moment of channel switching.

Full Text
Published version (Free)

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call