Abstract
In the transient impulse test of simulated lightning, the accuracy and reliability of digital impulse measurement secondary system has always been a research hotspot in industry and academia. In this paper, an oversampling mean filtering algorithm is proposed to overcome the disadvantages of high-resolution ADC and low-resolution ADC which are greatly affected by quantization noise in the secondary system of impact test measurement. By increasing the sampling frequency and mean filtering, this method can achieve the accuracy index that can only be obtained by expensive high-resolution chip using cheap low-resolution chip, and it is easy to implement. In this paper, the principle of the algorithm is analyzed in detail, and its implementation is described. On this basis, the performance of the algorithm is discussed through simulation analysis, and the effectiveness of the algorithm is verified through experiments.
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