Design of Embedded Self-Testing Checkers for t-UED and BUED Codes

Abstract

In this article we present a new method for designing self-testing checkers for t-UED and BUED codes. The main idea of this method is to map words of the considered code to words of a code of the same type in which the value of t or the number of check bits is reduced and repeating this with the obtained words until a parity code is obtained, or to translate the code words into words of a code for which such a mapping is possible. First we consider Borden codes for t e 2k − 1, Bose, and Bose-Lin codes. The mapping operation is realized by averaging weights and check symbol values of the code words. The resulting checkers have a simple and regular structure. This structure is independent on the set of code words that is provided by the circuit under check. The checkers are very well suited for use as embedded checkers since they are self-testing with respect to single stuck-at faults under very weak assumptions. All three checker types can be tested with 2 or 3 code words. We also propose a novel approach to design checkers for Blaum codes that require much less code word tests than existing solutions.