Abstract
The paper deals with the immunity to Electromagnetic Interference (EMI) of the current source for Ultra-Low-Voltage Integrated Circuits (ICs). Based on the properties of IC building blocks, such as the current-splitter and current correlator, a novel current generator is conceived. The proposed solution is suitable to provide currents to ICs operating in the sub-threshold region even in the presence of an electromagnetic polluted environment. The immunity to EMI of the proposed solution is compared with that of a conventional current mirror and evaluated by analytic means and with reference to the 180 nm CMOS technology process. The analysis highlights how the proposed solution generates currents down to nano-ampere intrinsically robust to the Radio Frequency (RF) interference affecting the input of the current generator, differently to what happens to the output current of a conventional mirror under the same conditions.
Highlights
Ubiquitous electronics systems require low power consumption to reduce the dependence on batteries through energy harvesting techniques [1,2]
Among the basic on-chip requirements, the current generation for Integrated Circuits (ICs) operating in sub-threshold in the presence of Radio Frequency Interference (RFI) is addressed in this paper
The above-described circuit topologies operating in sub-threshold are employed as building blocks of a new current biasing circuit sketched in Figure 6 in which the input current to be mirrored and scaled is affected by Electromagnetic Interference (EMI)
Summary
Ubiquitous electronics systems require low power consumption to reduce the dependence on batteries through energy harvesting techniques [1,2]. ICs for implanted devices can include on-chip bias current generators operating in subthreshold to improve current matching as well as allow easy bias current tuning [21,22] For this reason, among the basic on-chip requirements, the current generation for ICs operating in sub-threshold in the presence of Radio Frequency Interference (RFI) is addressed in this paper. Among the basic on-chip requirements, the current generation for ICs operating in sub-threshold in the presence of Radio Frequency Interference (RFI) is addressed in this paper
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