Abstract

SummaryThis work presents a macro modeling approach for the time‐mode cyclic ADC. The proposed ADC macro model is realized using the time‐to‐voltage converter (TVC) and the voltage‐to‐time converter (VTC) that are the key building blocks of time‐mode ADCs. In addition, the effect of circuit nonidealities and error sources of the time‐mode ADC including parasitic capacitance, current source output resistance, switch on‐resistance, capacitor mismatch, and comparator offset are incorporated in the macro model. The simulation time of the proposed ADC macro model showed 87.1% reduction compared to the all transistor level ADC circuit. As a result, the proposed ADC macro model can facilitate the ADC design and leverage the ADC nonideality analysis. Furthermore, the proposed macro model can be used for ADC calibration scheme development. As a practical design example, the macro model for an 8‐bit time‐mode cyclic ADC has been realized, where the nonideality analysis, design optimization, and calibration scheme development based on the proposed macro model have been demonstrated.

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