Abstract
An integrated 0.35-/spl mu/m CMOS fast-shaping amplifier has been designed for coincidence detection and zero-cross time pulse-shape discrimination (PSD) in positron emission tomography (PET) and for high-rate event counting in computerized tomography (CT) with avalanche photodiode (APD)-based detectors. Analytical simulations of CR-RC/sup n/ filters of various order and shaping time constant were carried out to optimize the timing performance, keeping in mind the stringent channel density requirements of the detector front-end electronics. The filter was implemented with the biquadratic bandpass architecture using a folded cascode transconductance amplifier. The electronic timing resolution of the coincidence circuit was 92 ps in the ideal case without an APD (C/sub in/ = 0 pF), and 243 ps with an APD (C/sub in/ = 30 pF). By comparison, the same system with the CMOS shaper replaced by an Ortec 579 Fast Filter Amplifier set to a shaping time of 10 ns yielded an electronic time resolution of 79 ps in the ideal case without capacitance and 236 ps with the APD. The 511-keV coincidence time resolution for a crystal scintillator-based lutetium oxyorthosilicate (LSO)-APD detector was measured to be 1.49 ns.
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