Abstract
This study presents the design of an off-chip current sensor for IDDQ testing of CMOS (Complementary Metal-oxide Semiconductor) ICs (integrated circuit). It provides a linear voltage signal of IDDQ current with a conversion factor of 5 mV/μA without any amplification. A voltage-controlled switch is used to bypass the transient current peaks. It has also been shown that the sensor is capable of detecting IDDQ faults of a circuit at 100 kHz test frequency without degrading its performance.
Highlights
With the advent of semiconductor technology, a new era has begun in microelectronics
It has been seen that there are some physical defects usually in CMOS integrated circuits (ICs) such as gate oxide shorts, node bridges, etc. that cannot be detected by functional testing
Logic testing is still required to verify the functionality of the ICs and IDDQ testing improves the reliability of the testing
Summary
With the advent of semiconductor technology, a new era has begun in microelectronics. IDDQ testing measures the quiescent power supply current of an IC using suitable current sensor and the fault presence causes higher magnitude of IDDQ than the specified threshold value.
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