Abstract

RF signal carries very low amount of energy and can be easily dissipated as heat loss. Threshold voltage and leakage current that are inherent in MOS transistors significantly affect the performance of an RF AC to DC converter. A device with bulk connected to its drain improves the threshold voltage and leakage current. This work designs the half-wave and full-wave AC to DC converters with devices' bulk connected to source and devices' bulk connected to drain. The designs used the native devices in TSMC 0.18 micron CMOS technology, and were simulated using transient analysis in different process corners and operating temperatures. In simulations, the RF signal was represented by a sinusoidal input of 900 MHz frequency and of 390 mV amplitude. The sizes of transistors and the number of stages, of each converter, that resulted to highest power efficiency were determined via circuit simulations. The optimal design was a four-stage half-wave AC to DC converter with devices' bulk connected to drain, which produced a DC output of 2.7 V with 37.42 % efficiency at 100 kilo ohm load.

Highlights

  • Today’s technology allows electronic devices to be operated at low input voltages

  • This study aims to design an AC to DC converter for 900 MHz RF energy harvester circuit using Native CMOS device with proper connection of bulk

  • The third section is the design of an AC to DC converter base on multi stage half-wave rectifier using native CMOS device with bulk connected to source and bulk connected to drain

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Summary

Introduction

Today’s technology allows electronic devices to be operated at low input voltages. These low power devices can be used in many applications such as temperature sensors, pressure sensors, biomedical sensors and RFID systems. The works of Mandal et al [3] to Shokrani et al [8] proposes several threshold cancellation techniques to minimize the effect of the turn on voltage of the CMOS device. The drawback of using a low threshold voltage device is the increase in leakage current. This current should be minimized because it decreases the overall output voltage and efficiency of the circuit. A simpler leakage current prevention technique is used by Shokrani et al [8] in which was done by connecting the bulk to the drain of MOS transistor

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