Abstract
In this work, a new interconnect structure is proposed for the first time where copper-carbon nanotube composite interconnect is encapsulated by graphene barrier layers named here as copper-carbon (Cu-carbon) hybrid interconnects. The motivation behind this new structure is to utilize the enhanced conductivity of copper-carbon nanotube (Cu-CNT) composite and improved reliability of copper-graphene (Cu-GNR) hybrid in order to build a better interconnect structure for possible replacement of copper interconnects in near future VLSI applications. The steps required to fabricate this structure is also proposed by utilizing the fabrication methods of Cu-CNT composite and Cu-GNR hybrid materials. First-principles-based atomistic simulations suggest that Cu-Carbon hybrid structure is more conductive than its parent structures, i.e. Cu-CNT composite and Cu-GNR hybrid. This deduction is also supported by the circuit simulation results at 7 nm node which show that Cu-Carbon hybrid interconnect experiences least delay among all other alternatives. When compared to Cu-GNR, Cu-CNT and Cu interconnects, delay in 1 mm long Cu-Carbon hybrid interconnect is lesser by ~28%, ~41% and ~88%, respectively. Time-domain analysis suggests that Cu-Carbon hybrid interconnect has the steepest and sharpest step response. Cu-Carbon hybrid interconnect has proven to be superior than other alternatives in terms of signal integrity. Noise-delay-product in a 1 mm long Cu-Carbon hybrid is lesser by ~42%, ~47% and ~84% as compared to Cu-GNR, Cu-CNT and Cu interconnects, respectively. Power consumption is also least in Cu-Carbon hybrid interconnects. Power-delay-product in a 1 mm long Cu-Carbon hybrid is also reduced by ~41%, ~44% and ~43% as compared to Cu-GNR, Cu-CNT and Cu interconnects, respectively. These findings promote Cu-Carbon hybrid interconnect as a superior candidate for near future VLSI applications.
Highlights
C ONTINUOUS scaling down of device dimensions is not enough to reduce the overall chip delay in present technology era
This study proposes for the first time a new structure combining copper, carbon nanotube (CNT) and GNR materials into a hybrid structure
copper-carbon nanotube (Cu-CNT) composite and Cu-GNR hybrid are well investigated structures used as interconnects to replace copper interconnects in near future VLSI applications
Summary
C ONTINUOUS scaling down of device dimensions is not enough to reduce the overall chip delay in present technology era. For the first time, a new structure which combines copper, graphene, and CNT materials as a hybrid interconnect structure is proposed in this work. The proposed Cu-Carbon hybrid interconnect shown in Fig. 1 utilizes both these advantages of enhanced reliability and conductivity and emerges as a superior candidate compared to Cu-GNR and Cu-CNT composite interconnects as discussed in detail in subsequent sections. FIRST-PRINCIPLE STUDY The electronic properties of Cu-GNR hybrid, Cu-CNT composite and the proposed Cu-Carbon hybrid interconnects are investigated using the Density Functional Theory (DFT) approach [14]. This proves that Cu-Carbon hybrids are more conducting than Cu-GNR and Cu-CNT composites This deduction is supported by the circuit simulations shown in later sections. Cu-CNT composite is fabricated and that CuCNT composite is coated with graphene, resulting in Cu-Carbon hybrid interconnect. The carrier gas (argon) transports the reactive carbon and hydrogen radicals downstream to the Cu-CNT composite, where full graphene coverage can be achieved within 15 min at a deposition temperature of 650 ◦C
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