Abstract
Proliferation of flexible, wearable and portable electronics come with new challenges of system reliability. Particularly, flexible and wearable electronics cause more frequent and are more susceptible to electromagnetic interference (EMI) effects and electrostatic discharge (ESD) failures, and have unique requirements for design-for-reliability (DfR) associated with EMI and ESD immunity to achieve electromagnetic compatibility (EMC) compliance. This paper outlines the key challenges in design for EMI and ESD immunity for wearable microsystems and discusses potential design for EMI/ESD immunity solutions.
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