Abstract
At speed delay testing is important for embedded systems. Attempts to solve the problems of delay testing only with non-scan or scan-based tests are unsuccessful. There is no need to oppose these tests, but it is necessary to use both taking full advantage of their opportunities. Design flow and the ability to use non-scan and scan-based ATPG, functional test and fault simulation is presented. The goal is to detect as many faults with non-scan at-speed test. The remaining faults are detected with a scan-based test. As a result, there are less of undetected faults and the length of the scan-based test is reduced. The proposed approach provides more flexibility for test generation. Design flow forced the development of new methods for speeding up fault simulation and for more efficient generation of input patterns. Experimental results demonstrate the possibilities of approach.
Highlights
Circuit testing using only the inputs and outputs is the easiest way
Design flow, which allows flexibility in the use of non-scan and scan-based test generation approaches and gradual addition of the test are described in the third section
When all the possibilities of non-scan test generation are exhausted scan-based ATPG is used for the remaining faults
Summary
Circuit testing using only the inputs and outputs is the easiest way. The test generation problem is too complex to be resolved within a reasonable period of time for large circuits. Scan-based test can detect faults, which do not affect the functioning. In this case, there is a so-called problem of overtesting. Non-scan test received only for part of faults makes sense because it is possible to detect more defects through at speed testing and to shorten the scan-based test. The functional test is usually generated by a higher level of abstraction and is usually long It can detect the same faults as the test obtained using fully sequential generators. Rimantas Seinauskas: Design Flow Allowing the Effective Use of Non-scan and Scan-Based Tests important trends in test generation. Design flow, which allows flexibility in the use of non-scan and scan-based test generation approaches and gradual addition of the test are described in the third section. The conclusions of the article are presented in the last section
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