Abstract
Highly efficient designs and uniform designs are widely applied in many fields because of their good properties. The purpose of this paper is to study the issue of design efficiency for asymmetric minimum projection uniform designs. Based on the centered L2 discrepancy, the uniformity of the designs with mixed levels is defined, which is used to measure the projection uniformity of the designs. The analytical relationship between the uniformity pattern and the design efficiency is established for mixed-level orthogonal arrays with a strength of two. Moreover, a tight lower bound of the uniformity pattern is presented. The research is relevant in the field of experimental design by providing a theoretical basis for constructing the minimum number of projection uniform designs with a high design efficiency under a certain condition. These conclusions are verified by some numerical examples, which illustrate the theoretical results obtained in this paper.
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