Abstract
A test methodology for the differential cascode voltage switch (DCVS) is described. The design methodology of DCVS makes it more testable compared to other technologies. In testing DCVS, a precharge state always precedes a test pattern or a functional pattern. This test methodology permits detection of delay faults and stuck-open faults. The good circuit outputs of a logic tree are orthogonal. A high percentage of defects can be detected through the XOR gate designed for testing nonorthogonal faults. >
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