Abstract
RF technology is widely used in wireless communication. Due to the small size, high density and high frequency, RF IC testing based on ATE faces many challenges. This paper took a LNA chip fabricated by a GaAs process as an example, simulated the test circuit and studied two methods of RF impedance matching by using the software of Agilent ADS. The results show that it solves the impedance mismatch of the input and output ports in RF test, providing the theoretical support to the design and production of RF test board.
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