Abstract
Metamaterial (MTM) sensor based on Twin-Slit Complementary Split Rectangular Resonator (TS-CSRR) is proposed for measurement of dielectric properties of the materials under test (MUT). Array of two TS-CSRR structures on single board is designed and simulated on CST Microwave Studio by using low cost FR4 substrate. Very sharp response with notch depth of −49.9 dB is obtained at resonance frequency of 7.9 GHz. Array of multi structured CSRR on single board with single band and very sharp response is the novelty. DNG (Double Negative) and NIM (Negative Indexed) properties are extracted from scattering parameters. The transcendental equation is derived to calculate relative permittivity and resonance frequency of unknown MUTs. The response of proposed sensor is like a narrow stop band filter. This approach is very modest, simple in fabrication and decreases cost and computational time. Proposed sensor can be used effectively in numerous fields like satellite communications, radar systems, bio-sensing and liquid characterization.
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