Abstract
A new method for design of multilayer antireflection coatings (ARCs) which makes use of a specified reflectance value R0, either zero or nonzero at a particular wavelength λ0, is developed. It offers an explicit scheme for evaluation of the optical/geometrical thickness of each layer, and the design variables are optimized with respect to integrated reflection loss R* over a specified bandwidth. It has been found that the method can be applied for design of wideband ARCs useful in the visible and IR regions, and the resulting bandwidth and residual reflection losses can be controlled as a function of R0. The method is found to be comprehensive so that more useful designs can be worked out, and it can be directly adopted to the design of single- and double-layer ARCs.
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