Design and Layout Effects on SET Propagation in 90-nm ASIC and FPGA Test Structures

Sana Rezgui,John Mccollum,Raymond Won

doi:10.1109/tns.2010.2060496

Design and Layout Effects on SET Propagation in 90-nm ASIC and FPGA Test Structures

Sana Rezgui, John Mccollum + Show 1 more

https://doi.org/10.1109/tns.2010.2060496

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Journal: IRE Transactions on Nuclear Science	Publication Date: Dec 1, 2010
Citations: 13

#Fault Injection Tests #Layout Effects + Show 8 more

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Abstract

SET propagations in ASIC-like and FPGA-like digital circuits are investigated, using 90-nm test structures, by fault injection and radiation tests. SET fault injection tests are used to show the dependence of the final SET-pulse on the design and layout of the logic circuit.

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