Abstract
The rapid technological progress has brought on the third generation of infrared detectors which keeps on asking for high performance test benches to evaluate them. DAQ system in a test bench has to be continuously improved to meet the demands for testing emerging new types of detectors. Based on the analysis of these demands from new features and new characteristics of the detectors, a high performance DAQ system prototype has been designed and implemented. Besides functionalities and flexible program-mability adapting for testing the variety of state-of-the-art infrared detectors, the superior performance of our system is embodied by ultra-low system background noise level (less than 70μV RMS noise), fast hardware on-line data compression, and advisable clock and trigger signals' distribution. A number of ultra-low noise design proposals have been proved to be effective by our preliminary test results. The system architecture makes it easy to be customized as different stand-alone devices to meet specific testing requirements, including no-limit the number of data acquisition channels.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
