Abstract
This paper presents an implementation of a data acquisition system for analog-to-digital converters (ADCs) using “Laboratory Virtual Instrument Engineering Workbench (LabVIEW)” as software for data analysis. The designed and implemented platform allows interaction with the device under test through means of data acquisition and instrument controls. Developing custom tests in LabVIEW can result in reduced test time, which in turn will help reduce costs in testing. This system was developed for evaluation purposes of ADC's static and dynamic parameters (gain error, offset error, DNL, INL, SNR, SINAD, IMD, etc.) using single and multi-frequency signals. The virtual control and analysis instrument was created in “LabVIEW” environment to control test signals generation and data acquisition. The testing performance of the platform is demonstrated using the classical ADC circuit “ADC0804”. A comparison with experimental results obtained by CANTEST platform from Bordeaux University (France) is also presented to highlight our platform.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
More From: International Journal of Metrology and Quality Engineering
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.