Design and imaging properties of a laser scanning microscope with a position-sensitive detector

Abstract

An economical method of microscopic image formation that employs a raster-scanning laser beam focused on a sample, while a non-imaging detector receives the scattered light, is presented. The images produced by this method are analogous to the scanning electron microscopy with visible effects of shadowing and reflection. Compared to a conventional wide-field imaging system, the system allows for a greater flexibility, as the variety of optical detectors, such as PMT and position-sensitive quadrant photodiode can be used to acquire images. The system demonstrates a simple, low-cost method of achieving the resolution on the order of a micron. A further gain in terms of resolution and the depth of focus by using Bessel rather than Gaussian beams is discussed.