Design and evaluation of precise current integrator for scanning probe microscopy

Abstract

Several of the scanning probe microscopy (SPM) techniques, such as the scanning tunnelling microscopy (STM) or conductive atomic force microscopy (C-AFM), rely on precise measurements of current flowing between the investigated sample and the conductive nanoprobe. The parameters of current-to-voltage converter (CVC), which should detect current in the picompere range, are of utmost importance to those systems as they determine the microscopes’ measuring capabilities. That was the motivation for research on the precise current integrator (PCI), described in this paper, which could be used as the CVC in the C-AFM systems. The main design goal of the PCI was to provide a small and versatile device with the sub-picoampere level resolution with high dynamic range in the order of nanoamperes. The PCI was based on the integrating amplifier (Texas Instruments DDC112) paired with a STM32F4 microcontroller unit (MCU).The gain and bandwidth of the PCI might be easily changed by varying the integration time and the feedback capacitance. Depending on these parameters it was possible to obtain for example the 2.15 pA resolution at 688 nA range with 1 kHz bandwidth or 7.4 fA resolution at 0.98 nA range with 10 Hz bandwidth. The measurement of sinusoidal current with 28 fA amplitude was also presented. The PCI was integrated with the C-AFM system and used in the highly ordered pyrolytic graphite (HOPG) and graphene samples imaging.