Abstract
Experimental demonstration of small angle (0.8 degrees-5 degrees ) direct UV-written X couplers in silica-on-silicon is presented. Maximum and minimum coupling ratios of 95%(+/-0.8%) and 1.9% (+/-1%), respectively, were recorded. The structures also display very low polarization and wavelength dependence. A typical excess loss of 1.0 dB(+/-0.5 dB) was recorded. Device modeling using the beam propagation method and an analytical model showed good agreement with experimental results over a broad crossing angle and wavelength range.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
