Design and demonstration of direct UV-written small angle X couplers in silica-on-silicon for broadband operation

Abstract

Experimental demonstration of small angle (0.8 degrees-5 degrees ) direct UV-written X couplers in silica-on-silicon is presented. Maximum and minimum coupling ratios of 95%(+/-0.8%) and 1.9% (+/-1%), respectively, were recorded. The structures also display very low polarization and wavelength dependence. A typical excess loss of 1.0 dB(+/-0.5 dB) was recorded. Device modeling using the beam propagation method and an analytical model showed good agreement with experimental results over a broad crossing angle and wavelength range.