Design and characterization of planar capacitive imaging probe based on the measurement sensitivity distribution

Abstract

Previous work indicated that the capacitive imaging (CI) technique is a useful NDE tool which can be used on a wide range of materials, including metals, glass/carbon fibre composite materials and concrete. The imaging performance of the CI technique for a given application is determined by design parameters and characteristics of the CI probe. In this paper, a rapid method for calculating the whole probe sensitivity distribution based on the finite element model (FEM) is presented to provide a direct view of the imaging capabilities of the planar CI probe. Sensitivity distributions of CI probes with different geometries were obtained. Influencing factors on sensitivity distribution were studied. Comparisons between CI probes with point-to-point triangular electrode pair and back-to-back triangular electrode pair were made based on the analysis of the corresponding sensitivity distributions. The results indicated that the sensitivity distribution could be useful for optimising the probe design parameters ...