Design and calibration of a noise measurement system

Abstract

The setup principle and calibration method of a noise measurement system for frequencies from dc to 10 kHz are described. This system measures the current noise power spectral density of some device, and consists of a low-noise current preamplifier, a voltage preamplifier, and a dynamic signal analyzer which implements the fast Fourier transform (FFT). The noise aspects of the whole system can be modeled as a serial noise voltage generator and a parallel noise current generator at the input port, plus a system free of noise. The cross correlation of the two noise generators is an imaginary number because the system input stage is composed of some junction field effect transistors (JFET's). Via the thermal noise measurement of several resistors, we derive the magnitudes of the noise generators in addition to the input impedance and the total system gain. The imaginary cross correlation is obtained by the noise measurement of pure capacitance. With a well-calibrated procedure, we can measure the noise power down to 2/spl times/10/sup -27/ A/sup 2//Hz. Two systems with different input stages were calibrated with the same procedure and the noise measurement results of the various resistance values with the two systems all agree well with theoretical values. One of these with an input stage which has a much smaller noise current generator shows great improvement in the noise measurement of the high-impedance device.