Abstract
In modern industry the processing quality and precision become the concerned aspects. The cutting force dynamometer could ensure the two points by adjusting the cutting parameters. A piezoelectric dynamometer is introduced. The electric potential of X0 and Y0 crystal wafer has been analyzed by ANSYS under Fz, Fx and Mz. For the Fx and Mz measurement, the charge distribution expression is calculated by nonlinear elasticity and piezoelectric theory. The dynamometer is designed and the calibration experiments have been had. The nonlinearity and repeatability of Mz, Fx, and Fz are 0.77% and 1.05%, 0.46% and 0.58%, 0.34% and 0.69.
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