Abstract
Abstract In the present paper, a multilayer stack of Yb doped ZnO (YZO) and p-Si has been designed in which the total internal reflection of optical light is combined to form constructive interference. The mechanism behind light propagation in a stack is revealed, and factors affecting the reflectivity of the stacked reflector are analytically investigated. In the visible range, an optimized reflectivity up to 99.3% is reached from two bilayer stacks. The thickness of stack layers is optimized to validate Fresnel's Law and the same has been further authenticated by the experimental results obtained from the ellipsometer. The device structure is numerically analyzed using the full wave simulator CST microwave studio. Furthermore, the reflector bands are linearly reconfigured by angular manipulation of the incident light. The experimental and simulated outcome of the multilayer stacked reflector shows the highest reflectivity of 99.3% for 550 nm wavelength of visible frequency spectrum.
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