Derivatives of Sri Lankan Vein Graphite: Atomic Scale Study of Graphene Oxide and Reduced Graphene Oxide

Abstract

Aims: The present study examines the atomic-scale structures of Graphene Oxide (GO) and Reduced Graphene Oxide (RGO). Background: Electron microscopic studies on Sri Lankan vein graphite are considerably less; hence, this study focuses on the atomic-scale study of Sri Lankan vein graphite, using advanced electron microscopic techniques. Objective: The purpose of this research is to utilize the data obtained to explore the multidisciplinary characteristics of graphene to the maximum prospectively. Method: We report an atomic-scale study on Sri Lankan vein graphite (purest) derivatives using advanced electron microscopic techniques, including High-Resolution Transmission Electron Microscope (HRTEM), Scanning Transmission Electron Microscope (STEM), and Electron Energy Loss Spectroscopy (EELS). The present study examines the atomic-scale structures of Graphene Oxide (GO) and Reduced Graphene Oxide (RGO). Result: The results obtained exhibited an inter-atomic layer distance of 3.54 Å for RGO. The EELS study performed with the electron dose optimization for GO and RGO distinguished the differences in the C K edge with the oxygen functionalities. The XPS study confirmed the changes in oxygen functionalities obtained with EELS. Conclusion: The advanced electron microscopic techniques and other molecular spectroscopic analysis techniques allowed us to obtain a comprehensive study on Sri Lankan vein graphene-based structural and chemical features on an atomic scale.