Abstract
AbstractThe technique of Synchrotron White Beam topographic imaging in grazing Bragg-Laue geometries has been developed at the Stony Brook synchrotron topography station at the NSLS. This technique enables imaging of defects in subsurface regions of thickness which can range from hundreds of Angstroms to hundreds of microns as determined by the penetration depth of the X-rays. This penetration depth, which is shown to be determined by the kinematical theory of X-ray diffraction, can be conveniently varied, in a controlled manner, by simple manipulation of the diffraction geometry, thereby enabling a depth profiling of the defect content.The fundamentals of the technique are described, and its advantages and disadvantages compared to existing techniques are discussed in detail. Examples of application of the technique in the characterization of defects in thin epitaxial films of GaAs on Si, are given, and the general applicability of the technique is discussed.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.