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Abstract
In this work we use Auger electron spectroscopy depth profiling and grazing incidence X-ray diffraction (GIXRD) to study chemical composition and structure of the CdTe/CdS/ITO/glass heterostructure. The CdS layer was deposited on ITO (In2Sn2O7–x) substrates by chemical bath deposition and the CdTe film was deposited by double-step close space sublimation. We found by AES profiling a strong intermixing at the CdS/ITO and CdS/CdTe interfaces, confirmed by GIXRD and evidences of two diffusion steps for the CdS into the ITO matrix. Additionally, the CdS/ITO structure was separately investigated in order to know the influence of the substrate roughness on the heterostructure conformation. The morphology of the ITO substrate and the as-deposited CdS layer was studied by atomic force microscopy. The use of GIXRD showed to be useful to study the entire CdTe/CdS/ITO/glass heterostructure. The ITO roughness has proved to be an influencing factor in the structural features and suggested that CdS roughness can also influence the observed composition profiles.
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