Abstract
Raman spectroscopy has been combined with ion bombardment to obtain chemical compound identification as a function of depth in films containing Fe2O3. Experiments were performed using Fe2O3 single crystals, oxidized iron foil, and oxidized stainless steel. Low sensitivity to sputter induced chemical changes is a major advantage of the technique, allowing reliable chemical profiles to be obtained for these thin-film oxides.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Paper version not known
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
