Abstract
We present first experimental results on the fabrication and characterization of depth-graded x-ray multilayers providing a broad and well-defined reflectivity profile. We have designed and deposited irregular multilayer structures providing a practically constant reflectivity of about 20% around the first Bragg-reflection and a bandwidth of about 20% in both incident angle and photon energy. Detailed numerical simulations allow for the determination of residual errors in the layer stack.
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