Abstract

The analysis of industrially important electronic components of micro dimensions such as thin film transistor liquid crystal display color filter is of fundamental importance in consumer electronics. Three dimensional (3D) visualization, size, area, and surface roughness are important parameters for the analysis of micro components. For this purpose, the devices equipped with active but expensive depth estimation techniques are commonly used. However, these can be replaced by inexpensive passive methods. In this paper, we propose an inexpensive and simple system for the analysis of micro components. It comprises a CCD camera mounted on a conventional microscope and a passive optical method for 3D shape recovery. To improve the accuracy of the system, we introduce an accurate depth estimation scheme by using cubic degree Bezier–Bernstein polynomial. The proposed system is tested by using image sequences of synthetic and real objects. The experimental results demonstrate the usefulness and effectiveness of the proposed system for the analysis of micro size electronic components.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.