Abstract
Recently, Cd-free Cu(In,Ga)(S,Se)2-based “CIGSSe” thin film solar cells with a nominal In2S3 buffer layer deposited by the spray ion layer gas reaction technique resulted in photovoltaic performances comparable to that of CdS buffered references. In the past it was argued that diffusion processes across the In2S3∕CIGSSe interface play a significant role for the device quality. Investigating the interface formation by using x-ray photoelectron spectroscopy, the authors were able to confirm a strong interfacial diffusion involving Cu and Na from the CIGSSe.
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