Abstract

ABSTRACTZinc oxide films have been deposited from dimethyl zinc and oxygen in an atmospheric pressure laminar flow reactor at temperatures ranging from 300°C to 450°C. Highly oriented, conductive and transparent films were obtained at temperatures above 400°C by doping the films with fluorine. The crystallite sizes increase with increasing deposition temperature. From electron microprobe analysis, the doped films usually contained 0.5% to 2% fluorine atoms. Hall coefficient and resistance measurements at room temperature gave electron concentrations above 1020cm−3 and resistivities around 10−3 Ωcm. The doped films had mobilities varying from 20 to 40 cm2/V-s depending on the deposition temperature and fluorine concentration. These are the highest mobilities reported for zinc oxide films. The experimental results were then compared with those obtained from a simple resistivity network model which includes the effects of impurity and grain boundary scattering. Films with a sheet resistance of 5 Ω/square have visible absorption of about 5 to 10%. These properties are very suitable for applications as transparent electrodes for flat-panel displays and other electro-optical devices.

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