Abstract

Highly transparent and conducting fluorine-doped ZnO (FZO) thin films were deposited onto glass substrates by radio-frequency (RF) magnetron sputtering, using 1.5 wt% zinc fluoride (ZnF2)-doped ZnO as sputtering target. Structural, electrical, and optical properties of the FZO thin films were investigated as a function of substrate temperature ranging from room temperature (RT) to 300°C. The cross-sectional scanning electron microscopy (SEM) observation and X-ray diffraction analyses showed that the FZO thin films were of polycrystalline nature with a preferential growth along (002) plane perpendicular to the surface of the glass substrate. Secondary ion mass spectrometry (SIMS) analyses of the FZO thin films showed that there was incorporation of F atoms in the FZO thin films, even if the substrate temperature was 300°C. Finally, the effect of substrate temperature on the transmittance ratio, optical energy gap, Hall mobility, carrier concentration, and resistivity of the FZO thin films was also investigated.

Highlights

  • Transparent conducting oxide (TCO) thin films based on zinc oxide (ZnO) are promising for applications in various optoelectronic devices

  • Much more interest has been given to TCOs based on ZnO such as undoped ZnO thin films [4], Al-doped ZnO (AZO) thin films [5], and Ga-doped ZnO (GZO) thin films [6] due to their stability under hydrogen plasma which makes them a potential candidate for solar cells' technology based on thin-film silicon

  • The diffraction intensity of (002) peak critically increased as the substrate temperature increased from room temperature (RT) to 300°C, and a weak (004) peak was observed in the 300°Cdeposited fluorine-doped ZnO (FZO) thin films

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Summary

Introduction

Transparent conducting oxide (TCO) thin films based on zinc oxide (ZnO) are promising for applications in various optoelectronic devices. ZnO-based thin films present a lot of advantages such as low material cost, non-toxicity, and high chemical stability under the hydrogen plasma as compared to tin-doped indium oxide (ITO) [1]. Transparent conducting ZnO thin films have already been extensively used in solar cells, light-emitting diodes, and liquid crystal displays as a substitute for ITO [2,3]. Much more interest has been given to TCOs based on ZnO such as undoped ZnO thin films [4], Al-doped ZnO (AZO) thin films [5], and Ga-doped ZnO (GZO) thin films [6] due to their stability under hydrogen plasma which makes them a potential candidate for solar cells' technology based on thin-film silicon.

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