Abstract
Droplet-free deposition of Si nanoparticle films has been studied applying time-resolved imaging of Si nanoparticles formed by laser ablation of Si targets in Ar gas. We found that Si nanoparticles can be deposited not only on substrates facing to the targets but also on substrates placed beside the target. We further confirmed using a scanning tunneling microscope (STM), Si nanoparticles with sizes of 5–8 nm are deposited on substrates placed beside the target and using a scanning electron microscope (SEM) on the substrates, no droplets are observed.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.