Abstract
The system Pb[(Mg 1/3Nb 2/3) 0.90Ti 0.03]O 3 (PMNT) is classified as a relaxor ferroelectric material, paraelectric at room temperature. Ceramics of this compound were used as targets to produce thin films by pulsed laser deposition (PLD). A KrF excimer laser with λ=248 nm, a fluence of 2 J/cm 2 and 10 Hz repetition rate was used for the deposits on TiN/SiO 2/Si(100) substrates. Well adhered and uniform thickness films were obtained showing no evidence of as-deposited crystallinity. X-Ray Diffraction studies showed the development of microcrystalline structure with annealing starting at 500°C, evidenced also by scanning electron microscopy (SEM). Finally, a correlation between the measured dielectric properties of the films and their microstructure is made.
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