Abstract
The effect of preionization induced by depleted uranium (U23892) around the insulator sleeve on the x-ray emission of (2.3–3.9kJ) plasma focus device is investigated by employing Quantrad Si p-i-n diodes and a multipinhole camera. X-ray emission in 4π geometry is measured as a function of charging voltage with and without preionization. It is found that the preionization enhances CuKα and total x-ray yield about 100%, broadens the x-ray emission pressure range and x-ray pulse width, and improves shot to shot reproducibility of plasma focus operation. The pinhole images of x-ray emitting zones indicate that dominant x-ray emission is from the anode tip.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
