Abstract
SUMMARYDark current based on field emission current is considered to be a factor causing the vacuum electrical breakdown between multiaperture acceleration grids in the JT‐60 negative ion source. In this paper, we focus on field enhancement factor, which is a key parameter of field emission from the electrode. Vacuum breakdown testing for small‐sized electrodes simulating the multiaperture acceleration grids of the negative ion source was performed. We found the field enhancement factor and breakdown field for multiaperture electrodes, and we investigated the dependence of each parameter on the number of apertures. The results revealed that an increase in the average field enhancement factor after the end of conditioning resulting from an increase in the number of apertures led to a decrease in the dielectric strength of the multiaperture electrodes.
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