Abstract

The Fe 1− x Pt x -C granular films with different Pt atomic fractions (0.09 ≤ x ≤ 0.52) and film thicknesses (5 nm ≤ t ≤ 100 nm) were deposited on MgO(1 0 0) and SiO 2/Si(1 0 0) substrates by facing-target sputtering and post-annealing. With the increasing x, the ordered L1 0 FePt grains form. All of the films are ferromagnetic, and the easy axis is in the film plane. With the decrease of t, the films turn from hard ferromagnetic to soft ferromagnetic. The maximum coercivity of the 100-nm thick Fe 1− x Pt x -C granular films measured at a 10-kOe field is 3.7 kOe at x = 0.48. The coercivity of the Fe 0.56Pt 0.44-C granular films increases, and the magnetization measured at a 10-kOe field decreases with the increasing t. The reversal mechanism of the 100-nm thick Fe 1− x Pt x -C granular films turns from the domain wall motion to the Stoner–Wohlfarth rotation mode as x increases. However, the reversal mechanism of the Fe 56Pt 44-C granular films with different t approaches the Stoner–Wohlfarth rotation mode, and is film-thickness independent.

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