Abstract
AbstractThe proximity histogram (or proxigram for short) is used for analyzing data collected by a three‐dimensional atom probe microscope. The interfacial excess of Re (2.41 ± 0.68 atoms nm−2) is calculated by employing a proxigram in a completely geometrically independent way for γ/γ′ interfaces in René N6, a third‐generation single‐crystal Ni‐based superalloy. A possible dependence of interfacial excess on the variation of the threshold value of an isoconcentration surface is investigated using the data collected for René N6 alloy. It is demonstrated that the dependence of the interfacial excess value on the threshold value of the isoconcentration surface is weak. Copyright © 2004 John Wiley & Sons, Ltd.
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