Abstract
The transient negative and positive reflectance changes (Δ R's) around 2.0 and 2.2 eV, respectively, in polydiacetylene-toluene-sulfonate (PDA-TS) single crystal are observed by 532, 355, and 266 nm excitations. The negative reflectance change around 1.4 eV (Δ R(1.4 eV)) is observed only by the excitations at 266 and 355 nm. Both Δ R(7.0 eV) and Δ R(2.2 eV) are nearly proportional the excitation intensity (I ex), while ΔR(1.4 eV) is approximately proportional to I ex 1 2 .
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