Abstract
The texture and grain-size effects on the exchange bias in sputtered polycrystalline NiO/NiFe bilayers were studied. Two oriented antiferromagnetic NiO layers along (111) and (200) planes were fabricated on SiO2/Si(100) substrates by varying the Ar/O2 ratio. An exchange anisotropy field Hex was detected in both NiO/NiFe bilayers with a NiO(111) plane where Ni moments are in ferromagnetic (FM) order, and with a NiO(200) plane where Ni moments are in fully compensated antiferromagnetic (AF) order. In order to clarify the presence of the Hex in a NiO(200)/NiFe bilayer, we prepared NiO(200) layers with different grain sizes by controlling a total pressure at a constant Ar/O2 ratio in a sputter chamber. We observed that the Hex of the bilayer films with small grains of NiO(200) is larger than the Hex with large grains. This observation is consistent with a model that the exchange interaction is caused by the reorientation of the moments with AF layer spins rotating, rather than FM layer spins rotating at the interface of the bilayer.
Published Version
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
