Abstract
Based on the non-ideal planar defect model developed by the authors earlier and electron scattering flux pinning mechanism, we have derived a temperature dependence of critical current which predicts a same relation for both of I c and H c2 in dirty type-II superconductors. In order to test the prediction, the I c (T) and H c2 (T) were measured on PbBi-SiO multilayer films. The agreement between the theoretical and experimental results is satisfactory.
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Schedule a callMore From: Modern physics letters. B, Condensed matter physics, statistical physics, applied physics
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