Abstract
A straightforward approach using radiation scattering (X-ray or neutron) combined with atomistic modelling is used to accurately assess the pore dimensions in the porous silica, MCM-41. The method is used to calculate the density profile of nitrogen absorbed in this material at a variety of fractional pressures, p/p0, where p0 is the saturated vapour pressure, up to p/p0=0.36 at T=87K in the present instance. At this pressure two distinct layers of liquid nitrogen occur on the silica surface, with a relatively sharp gas-liquid interface. It is suggested surface tension effects at this interface strongly influence the growth of further layers.
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