Abstract

In order to clarify the origin of electron spin resonance (ESR) signals for amorphous germanium nitride (a-GeN), we have carried out the density-functional calculations of 14N hyperfine interaction constants (HFICs) for Ge-dangling bonds (Ge-DB) and weak Ge–N bonds (deformed N donor). The contribution from the 14N HFICs of Ge-DB to the ESR line width is nearly equal to that of Si-DB. The decrease in the g-value and the line width observed for a-GeN films with the N concentration originates from a decrease in the anisotropy of the g-tensor due to an increase of the N atoms around the Ge-DBs. The 14N HFIC calculated for the weak Ge–N bond with a bond length of 2.4 Å gives 45 G. It is in good agreement with the hyperfine structure in the ESR signal observed for a-GeN without hydrogenation, suggesting that a-GeN films prepared by sputtering include the weak Ge–N bonds.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call